A6 Scanning Microscope

The laser scanning microscope uses a point light source to illuminate the specimen, forming a small, well-defined spot on the focal plane. The fluorescent light emitted by this spot is collected by the objective lens and sent back to the beam splitter composed of a two-way color mirror along the original irradiation light path. . The laser scanning microscop beam splitter sends the fluorescence directly to the detector. There is a pinhole in front of the light source and the detector, which are called illumination pinhole and detection pinhole respectively.


A62.4501 Atomic Force Microscope
A62.4501 Atomic Force MicroscopeOpto-Edu (Beijing) Co., Ltd. Professional A62.4501 Atomic Force Microscope manufacturers,200+ Hot sale microscopes & Newest Models Updated Every MonthOperation modes Contact mode, Tapping mode,phase,friction, MFM,EFM  Scan angle 0~360° ,Sample size ?≤90mm,H≤20mm, Sample movement 0~20mm ,Max. scan range X/Y: 20μm, Z: 2μm, Pulse width of approaching motor 10±2ms, Resolution X/Y: 0.2 nm, Z: 0.05nm, Magnification of CCD Optical magnification:4X, Resolution 2.5μm,Scan rate 0.6Hz~4.34Hz Data points 256 x 256,512 x 512 Scanning control XY: 18-bit D/A, Z: 16-bit D/A, Feedback type DSP digital feedback, Data sampling One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously,  Feedback sampling rate 64.0KHz ,USB2.0, Compatible with Windows 98/2000/XP/7/8
A63.7081 Schottky Field Emission Gun Scanning Electron Microscope Pro FEG SEM
Schottky Field Emission Gun Scanning Electron Microscope Pro FEG SEM, 15x~800000x15x~800000x Schottky Field Emission Gun Scanning Electron MicroscopeE-Beam Acceleration With Stable Beam Current Supply Excellent Image Under Low VoltageNon Conduction Sample Can Be Observed Directly No Need To Be Sputtered In Low VoltageEasy & Friendly Operation Interface, All Controled By Mouse In Windows SystemLarge Sample Room With Five Axes Eucentric Motorized Stage Large Size, Max Specimen Dia.320mm
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