A63.7081 Schottky Field Emission Gun Scanning Electron Microscope Pro FEG SEM

Schottky Field Emission Gun Scanning Electron Microscope Pro FEG SEM, 15x~800000x

15x~800000x Schottky Field Emission Gun Scanning Electron Microscope

E-Beam Acceleration With Stable Beam Current Supply Excellent Image Under Low Voltage

Non Conduction Sample Can Be Observed Directly No Need To Be Sputtered In Low Voltage

Easy & Friendly Operation Interface, All Controled By Mouse In Windows System

Large Sample Room With Five Axes Eucentric Motorized Stage Large Size, Max Specimen Dia.320mm


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Product Description




A63.7081 Schottky Field Emission Gun Scanning Electron Microscope Pro FEG SEM
Resolution1nm@30KV(SE); 3nm@1KV(SE); 2.5nm@30KV(BSE)
Magnification15x~800000x
Electron GunSchottky Emission Electron Gun
Electron Beam Current10pA~0.3μA
Accelerating Voatage0~30KV
Vacuum System2 Ion Pumps, Turbo Molecular Pump, Mechanical Pump
DetectorSE: High Vacuum Secondary Electron Detector (With Detector Protection)
BSE: Semiconductor Four Segmentation Back Scattering Detector
CCD
Specimen StageFive Axes Eucentric Motorized Stage
Travel RangeX0~150mm
Y0~150mm
Z0~60mm
R360º
T-5º~75º
Max Specimen Diameter320mm
ModificationEBL;STM;AFM;Heating Stage;Cryo Stage;Tensile Stage;Micro-nano Manipulator;SEM+Coating Machine;SEM+Laser Etc.
AccessoriesX-Ray Detector(EDS),EBSD,CL,WDS,Coating Machine Etc.

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Advantage and Cases
Scanning electron microscopy (sem) is suitable for the observation of the surface topography of metals, ceramics, semiconductors, minerals, biology, polymers, composites and nano-scale one-dimensional, two-dimensional and three-dimensional materials (secondary electron image, backscattered electron image).It can be used to analyze the point, line and surface components of microregion.It is widely used in petroleum, geology, mineral field, electronics, semiconductor field, medicine, biology field, chemical industry, polymer material field, criminal investigation of public security, agriculture, forestry and other fields.


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